Contact and Non-Contact sheet resistance measurement systems for implantation, diffusion, metallization, and many other applications.
Non-contact sheet resistance and leakage measurement of ultra shallow junctions (UJS). Measurement on production wafers. Semi-automated and fully automated cassette to cassette systems available.
FSM will be presenting and demonstrating Non-Contact Stress Metrology for Flexible Electronics at the 2018 FLEX Conference in Monterey CA, Feb. 12-15, 2018.Feb 12, 2018
FSM will be presenting at the ASMC 2018 in Saratoga Springs, NY.Apr 30, 2018
FSM will be presenting at the International Conference on Metallurgical Coatings and Thin Films (ICMCTF) in San Diego, CA.Apr 23, 2018