Contact and Non-Contact sheet resistance measurement systems for implantation, diffusion, metallization, and many other applications.
4-Point Probe Technique for measuring the sheet resistance of epi, metal films, substrates. Table top and fully automated cassette to cassette systems available.
Frontier Semiconductor will be moving to its new location: 165 Topaz St., Milpitas, CA 95035, USA.Apr 15, 2018
FSM will be presenting at the MRS Spring Conference in Phoenix, AZ April 3-5, 2018.Apr 03, 2018
FSM will be presenting at the ASMC 2018 in Saratoga Springs, NY.Apr 30, 2018
FSM will be presenting at the International Conference on Metallurgical Coatings and Thin Films (ICMCTF) in San Diego, CA.Apr 23, 2018