Contact and Non-Contact sheet resistance measurement systems for implantation, diffusion, metallization, and many other applications.
Non-contact sheet resistance and leakage measurement of ultra shallow junctions (UJS). Measurement on production wafers. Semi-automated and fully automated cassette to cassette systems available.
Frontier Semiconductor moved to its new location: 165 Topaz St., Milpitas, CA 95035, USA.May 01, 2018
FSM will be presenting at the ASMC 2018 in Saratoga Springs, NY.Apr 30, 2018
FSM will be presenting at Semicon West in San Francisco, Ca, July 10-12, 2018. Please visit us at booth #2332 in the South Hall.Jul 10, 2018
FSM will be presenting at SPIE Optics and Photonics Conference in San Diego.Aug 20, 2018