Contact and Non-Contact sheet resistance measurement systems for implantation, diffusion, metallization, and many other applications.
4-Point Probe Technique for measuring the sheet resistance of epi, metal films, substrates. Table top and fully automated cassette to cassette systems available.
Non-contact sheet resistance and leakage measurement of ultra shallow junctions (UJS). Measurement on production wafers. Semi-automated and fully automated cassette to cassette systems available.
Frontier Semiconductor moved to its new location: 165 Topaz St., Milpitas, CA 95035, USA.May 01, 2018
FSM will be presenting at Semicon West in San Francisco, Ca, July 9-11, 2019. Please visit us at booth #243 in the South Hall.Jul 09, 2019
FSM will be presenting at SPIE Photonics West in San Francisco, Ca, February 2 -7, 2019.Feb 02, 2019