A Michelson Interferometer with a low coherence light source is used to determine distances: L2 is the beam path length from the light source LS to a surface or interface on the wafer w and back to the detector D. L1 is the beam path from LS to the reference mirror and back to D. If L1 = L2 interference is observed.
Frontier Semiconductor moved to its new location: 165 Topaz St., Milpitas, CA 95035, USA.May 01, 2018
FSM will be presenting at Semicon West in San Francisco, Ca, July 10-12, 2018. Please visit us at booth #2322 in the South Hall.Jul 10, 2018
FSM will be presenting at the ASMC 2018 in Saratoga Springs, NY.Apr 30, 2018
FSM will be presenting at the International Conference on Metallurgical Coatings and Thin Films (ICMCTF) in San Diego, CA.Apr 23, 2018